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          <family>Tavkhelidze</family>
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      </item>
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          <family>Skhiladze</family>
          <given>G.</given>
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          <family>Bibilashvili</family>
          <given>A.</given>
        </name>
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          <family>Tsakadze</family>
          <given>L.</given>
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          <family>Jangidze</family>
          <given>L.</given>
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          <family>Taliashvili</family>
          <given>Z.</given>
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          <family>Cox</family>
          <given>I.</given>
        </name>
      </item>
      <item>
        <name>
          <family>Berishvili</family>
          <given>Z.</given>
        </name>
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    <title>Electron Tunneling Through Large Area Vacuum Gap -- Preliminary Results</title>
    <ispublished>pub</ispublished>
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      <item>T1</item>
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      <item>fac_eng</item>
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    <abstract>We have obtained tunneling currents of over IO A through
the vacuum gap between Conformal electrodes having an
effective area on the order of 0.1-1 cm^2. The large area
vacuum gap is obtained by using a surface replication method
that allows for two electrodes to have precisely matched
topographies. &apos;The width of the vacuum gap within the range
of 30-100 A is regulated using piezoelectric actuators. These
same actuators are used to regulate angles between the
electrodes. Measured I-V characteristics show that the overall
current through the system can be represented as the sum of
the tunneling current and the current running through the
short circuits between electrodes. and that tunneling current
becomes dominant at distances greater than 30 A. The
dependence of the capacitance and conductance on the
distance between electrodes is in good agreement with the
simple model of electrodes separated by a vacuum gap. Such
an electron tunneling device could be used for cooling and
power generation, as well as for other applications</abstract>
    <date>2002</date>
    <pagerange>435-438</pagerange>
    <event_title>Thermoelectrics, 2002. Proceedings ICT &apos;02. Twenty-First International Conference on</event_title>
    <event_type>conference</event_type>
    <refereed>TRUE</refereed>
    <official_url>http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1190354</official_url>
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